Optical Metrology Systems: VIS NIR Spectrum

R-FLEX

R-FLEX wavefront sensor setup for visible and NIR optical characterization from 400 to 1100 nm

R-FLEX LA

Optical Engineer Companion optical metrology solution with no alignment, no optical table and instant reconfiguration

MESO

Interferometry metrology system for at-wavelength testing of flat optics from 1.5 to 6 inches. Fizeau interferometry alternative