High-accuracy wavefront metrology for optics and lasers in the SWIR
The benefits of wavefront sensing-based metrology in the SWIR originate first in the robustness and accuracy of Shack-Hartmann as a 25-year track record with the most demanding clients from space agencies and industries to semiconductors, lasers, free-space telecoms and AR/VR designers and manufacturers.
The LIFT technology brings a 16-fold increase in resolution, making the HASO SWIR LIFT 160 an ideal instrument for high-resolution metrology in the SWIR:
– to analyze any wavefront from 900 to 1700 nm;
– to align complex optical systems such as telescopes in combination with an R-FLEX2 SWIR;
– to assess flat optics quality for example when combined with an R-FLEX2 SWIR and an R-FLEX LA SWIR.
Last and definitly not least, all our wavefront sensors are compatible with the OPTICAL ENGINEER COMPANION system allowing for endless possibilities in combining wavelengths, beam diameter, focalization and evolving needs.
These instruments provide high quality measurements and offer outstanding versatility and user-friendliness in both hardware and software. They are capable of measuring numerous parameters: Modulation Transfer Function (MTF), Point Spread Function (PSF), wavefront aberrations, Zernike or Legendre polynomials, surface form, and optical quality.
The OPTICAL ENGINEER COMPANION in the SWIR
The Optical Engineer Companion in the SWIR brings a lot to engineers and scientists alike.
It combines at will and instantly any of our 3 HASO wavefront sensors in the SWIR with our R-FLEX2 SWIR metrology system and any of our 3 R-FLEX LA platforms for diameters ranging from 75 to 150 mm.
A selection of metrology laser sources at different wavelengths and focalization modules allow for dozens of different combinations and setups, making it a true Swiss-army knife of optics and photonics in the SWIR.
All our SWIR instruments are OEC compatible.