SWIR optical metrology

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Relevant products

To me the top 3 advantages of the OEC are, first you have instant access to the visualization, there is no post-processing. Second I would put the fact that you can use it outside the lab, there is no need for an optical table. And last but certainly not least, you can build your own instrument and adapt it to your needs as they evolve.

Adam A.

Optical Engineer

HASO SWIR

HASO4 SWIR 1550

R-FLEX2 SWIR

R-FLEX LA SWIR

High-accuracy wavefront metrology for optics and lasers in the SWIR

Optical metrology is a keystone in the manufacturing of high-performance optical components and systems; it has been our core domain of expertise for the past 25 years. Imagine Optic has developed a full range of metrology tools in the SWIR  spectral range for optics quality control, optical system alignment, and surface measurement. Optimized for both production and R&D environments, Imagine Optic’s metrology instruments range from stand-alone Shack-Hartmann wavefront sensors to automated optical metrology systems. 

These instruments provide high quality measurements and offer outstanding versatility and user-friendliness in both hardware and software. They are capable of measuring numerous parameters: the modulation transfer function (MTF), Point Spread Function (PSF), wavefront aberrations, Zernike or Legendre polynomials, surface form, and optical quality.

Applications

MTF

On- & off-axis metrology

Application notes