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BEST FOR VERSATILITY
– Characterize optical surfaces
– Characterize chromatic aberrations
– Analyze the transmitted wavefront of optical systems with double-pass configuration
– Optimize the alignment of complex systems
– On and off-axis 3D MTF

KEY SPECS
– Multiple options as per focusing objectives and collimating beam sizes
– λ/200 RMS measurement accuracy in double-pass configuration
– Insensitive to vibrations and atmospheric turbulence

R-FLEX2 SWIR

SWIR optical characterization

The R-Flex2 SWIR is the second generation of our versatile optical metrology system in the 1000-1700 nm range. It instantly combines our HASO4 SWIR or HAS04 SWIR 1550 wavefront sensors with a collimator and a light source.

PLUG AND CLICK
– Standard or Custom adaptable F# modules
– HASO4 SWIR and HASO4 SWIR 1550 compatible
– R-Flex LA SWIR compatible
– Standard or Custom Single Mode Laser Source
– Waveview4 software

HASO4 SWIR HASO4 SWIR 1550
Measurement Points Up to 1280 Up to 1280
Max Frequency 150 Hz 99 Hz