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R-FLEX2

Visible & NIR optical characterization

R-FLEX2

Visible & NIR optical characterization

R-Flex2 is the second generation of our versatile optical metrology system that instantly combines any of our HASO4 wavefront sensors in the 400 – 1100 nm range with a collimator and a light source.

R-FLEX2 Metrology system

 

R-FLEX2 Visible NIR optical metrology is the second generation of our versatile optical metrology system that instantly combines any of our HASO4 wavefront sensors in the 400 – 1100 nm range with a collimator and a light source.

 


PLUG AND CLICK

– Standard or Custom adaptable F/# modules
R-Flex LA compatible
– Standard or Custom Single Mode Laser Source
– Waveview4 software

 

BEST FOR VERSATILITY

– A great choice for lab or industrial application
– Sucessfully used in the most demanding of applications in optical metrology, microscopy and laser diagnostics.
– Optimize the aligment of complex systems
– On and off-axis 3D MTF

 

R-FLEX2 Visible NIR optical metrology System KEY SPECS

– Multiple options as per focusing objectives and collimating beam sizes
– λ/200 RMS measurement accuracy in double-pass configuration
– Insensitive to vibrations and atmospheric turbulence

– λ/200 rms measurement accuracy in double-pass configuration
– Patented technology, which allows simultaneous and independent measurement of phase and intensity
– Insensitive to vibrations and atmospheric turbulences
– Platform compatible with fibered light sources in 400-1100 nm wavelength range
– Delivered with WaveView metrology  software
– Collimated or diverging exit beam with several standard focusing modules from F/0.9

– Removable Visible NIR optical metrology wavefront sensor for using it as a stand-alone unit
– Highly accurate wavefront analysis even with central obscuration and spider-beam types
– Several accessories available , such as laser diode light sources, reference mirrors for calibration, translation stages, etc
– Latest generation of HASO Shack-Hartmann