BEST FOR VERSATILITY
– Characterize optical surfaces
– Characterize chromatic aberrations
– Analyze the transmitted wavefront of optical systems with double-pass configuration
– Optimize the alignment of complex systems
– On and off-axis 3D MTF
KEY SPECS
– Multiple options as per focusing objectives and collimating beam sizes
– λ/200 RMS measurement accuracy in double-pass configuration
– Insensitive to vibrations and atmospheric turbulence
R-FLEX2 SWIR
The R-FLEX2 SWIR metrology system is the second generation of our versatile optical metrology system in the 1000-1700 nm range. It instantly combines our HASO4 SWIR or HAS04 SWIR 1550 wavefront sensors with a collimator and a light source.
PLUG AND CLICK
– Standard or Custom adaptable F# modules
– HASO4 SWIR and HASO4 SWIR 1550 compatible
– R-Flex LA SWIR compatible
– Standard or Custom Single Mode Laser Source
– Waveview4 software
| HASO4 SWIR | HASO4 SWIR 1550 | |
| Measurement Points | Up to 1280 | Up to 1280 |
| Max Frequency | 150 Hz | 99 Hz |