LIFT SWIR 160
Quality High Resolution wavefront sensing in the 980-1650nm spectrum
LIFT SWIR 160
Quality High Resolution wavefront sensing in the 980-1650nm spectrum
The LIFT SWIR 160 phase retrieval wavefront sensor is based on an InGaAs camera, offering high accuracy, large dynamic range and high-speed acquisition frequency in the NIR SWIR spectral range.
It features the new SpotTracker technology, which provides absolute wavefront sensing and tilt information and makes sensor alignment a mere formality.
Check out the HASOs Table to see our full HASO and LIFT series: compare specs and choose what fits best your requirements!
LIFT SWIR 160 Wavefront Sensor
LIFT SWIR 160 phase retrieval wavefront sensor combines all the unique features developed by Imagine Optic during 30+ years of innovation and customers feedback: ease of use (absolute measurement thanks to the embedded factory calibration), high performance (high accuracy of lambda/100 RMS, very large dynamic range), robustness (phase measurement independent of beam intensity variation, achromaticity over calibrated spectral range, insensitivity to vibrations) together with ultra high resolution (spatial resolution x16 compared with Shack Hartmann)
The LIFT SWIR 160 wavefront sensor is fully compatible with the Optical Engineer Companion, our family of versatile modules that combine together instantaneously to create any optical testing configuration you need.
Applications+ Quantify optical system’s aberrations
+ Characterize complex optics + Measure Mid-spatial frequency (MSF) errors + Check if optical mount distorts optics + Verify compliance with specifications + Align system for optimal performance + Predict system’s focalization and imaging quality + Measure effects of temperature and gravity on performance + Diagnose laser beam, adjust and check pointing stability + Collimate optical systems and lasers + Quantify optical components and systems dependency to wavelength
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Best For+ High spatial sampling testing |
Software
Description |
Specifications |
Pupil size | 9.3 x 7.4 mm² |
Absolute Accuracy (RMS) | λ/100 |
Repeatablility (RMS) | < λ/200 |
Phase Sampling | 160 x 128 |
Interface | USB3 |
Wavelength | 980-1650nm |
Max. acquisition frequency | 150 Hz |