BROADBAND HARD X-RAY WAVEFRONT SENSOR FOR LIVE BEAMLINE CHARACTERIZATION AND ALIGNMENT
Imagine Optic’s Haso HXR offers live, single-shot wavefront measurement with high resolution, dynamic range and accuracy over a broad hard x-ray range. It is the perfect tool for synchrotron or X-FEL beamline scientists, allowing for easy characterization and alignment, as well as phase imaging.
Key features
- Live, single-shot visualization of the wavefront
- Achromatic over a broad 5-25keV energy range
- High accuracy
- No access to the focal point required
- Comprehensive metrology software
Examples of applications
- Source characterization
- Real-time alignment of optical systems, e.g. KB, toroidal, etc.
- Phase imaging of biological material, nanoparticles, cultural heritage
- Precise driving of X-Ray active optics
Imagine Optic’s HASO HXR wavefront sensor, developed in collaboration with Brookhaven National Laboratory (BNL), is the only device of its kind available that offers you the extreme precision and direct measurement functionality needed for today’s demanding X-Ray beamlines.
It incorporates 20 years of experience in the optimal design of Hartmann sensor combined with our pioneering in EUV and X-Ray wavefront sensing. When used for the alignment of focusing optics or for driving active optics, it becomes a powerful tool providing optimal micro and nano-beam focusing and precise control of the focal shape. Since it provides precise wavefront sensing with high spatial sampling, it can also be used for phase imaging of non-absorbing, homogeneous samples.
When combined with our software packages, you can easily conduct wavefront acquisition and reconstruction. Additional add-on modules offer features including extended wavefront reconstruction and Point Spread Function (PSF), as well as a dynamic library that enables you to build your own software applications.
Specifications
| Description | HASO HXR |
| Aperture dimension | 3 x 3 mm² |
| Number of sub-apertures dedicated for analysis | 150 x 150 |
| Maximum beam divergence | 1.5 mrad |
| Sensitivity | λ/35 RMS |
| Wavefront measurement accuracy in absolute mode 1 | Better than λ/10 @ 13.5nm RMS |
| Tilt measurement sensitivity | 80 nrad RMS |
| Spatial sampling | 20 µm |
| Typical flux needed at 1s exposure | 1011 photon/s |
| Exposure time range | 100 ms – 900 s |
| Working photon energy (wavelength)3 | 5- 25 keV (50 pm – 250 Pm) |
| Operating system | Windows 10 |
| Dimension | 480 x 155 x 135 mm3 |
| Signal interface | USB |
| Interface / Power supply | USB / included |
Downloads
Service Documents