Quantum 

Optical metrology solutions designed for optical testing and qualification needs in lithography manufacturing

Imagine Optic provides state-of-the-art optical metrology and adaptive optics solutions engineered for quantum technology applications such as atomic trapping, quantum communication, and quantum computing. Utilizing ultra-sensitive Shack-Hartmann wavefront sensors and deformable mirrors, our systems deliver high-accuracy real-time wavefront measurement and correction in the VIS-NIR and SWIR spectral ranges. These instruments enable precise optical system alignment, beam shaping, and wavefront control critical for manipulating quantum states, enhancing entanglement fidelity, and maintaining coherence in quantum information processes.

 Trusted by leading quantum researchers, Imagine Optic advances the precision and scalability of quantum photonics by enabling accurate, adaptive wavefront shaping and system optimization indispensable for the emerging quantum technology landscape.

Quantum computing

Characterize spatial modes, orbital-angular-momentum (OAM), optimize the point spread function (PSF) and signal-to-noise ratio, improve single-mode fiber coupling and characterize and correct sources by measuring aberrations with our Shack-Hartmann wavefront sensing-based diagnostic solutions.

Atomic Trapping

Spatial Light Modulators are commonly used in the architecture of optical traps. These SLMs must be controlled and a HASO wavefront sensor with the software WaveTune are the ideal tools to optimize the SLM shape which will improve the trap size and stability.

Quantum Key Distribution 

The transmission in free space of quantum keys is challenging due to air turbulence which destroy the coherence and reduce drastically the link efficiency. Our CIAOs (VIS and SWIR) have been designed to be compatible with QKD needs (no polarization impact, dichroic beam splitter). The effect of air turbulence is reduced and the photons delivered. 

Applications

 

+ Optical alignment of systems/optical setup
+ Wavefront measurment

 

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