Fizeau Like Optical Metrology Systems 

MESO VIS NIR

MESO metrology system for interferometric testing of flat optical surfaces in VIS-NIR

MESO SWIR

MESO SWIR metrology system for at-wavelength interferometric testing of flat optics

Fizeau-Like Metrology: Precision Beyond Classical Interferometry

Fizeau-like metrology systems refer to modern optical measurement solutions that deliver accuracy comparable to Fizeau interferometry while offering greater robustness, flexibility and suitability for industrial environments. These systems are designed to support optical manufacturers who require reliable, at-wavelength and high-throughput measurements beyond controlled laboratory conditions.

At Imagine Optic, our MESO™ metrology platforms (VIS and SWIR) embody this Fizeau-like approach by combining high wavefront measurement accuracy with vibration-insensitive operation and production-ready automation.

What Is a Fizeau-Like Metrology System?

A Fizeau-like metrology system provides surface and wavefront characterization capabilities similar to those of classical Fizeau interferometers, while removing many of the practical constraints associated with interferometric setups.

Fizeau-like systems are typically characterized by:

  • Absolute wavefront and surface measurements

  • High spatial resolution comparable to interferometric techniques

  • Reduced sensitivity to vibrations and air turbulence

  • Compatibility with shop-floor and in-situ measurements

  • At-design wavelength testing

These characteristics make Fizeau-like metrology systems particularly attractive for modern optical manufacturing workflows.

When to Use Fizeau-Like Metrology

Fizeau-like metrology systems are well suited for:

  • Optical quality control close to the production line

  • In-situ process monitoring during manufacturing

  • Testing of flat and plane-parallel optics at their operating wavelength

  • Environments where vibration isolation is impractical

  • High-throughput inspection of optical components

They are often used in addition to classical Fizeau interferometers, extending metrology capabilities from the laboratory to production.

MESO™ – Fizeau-Like Metrology by Imagine Optic

The MESO™ Metrology System is Imagine Optic’s Fizeau-like solution for optical surface and wavefront measurement. It leverages advanced wavefront sensing technologies to deliver precise, repeatable and absolute measurements without relying on interference fringes.

MESO systems are designed for ease of use, fast setup, and industrial robustness, making them ideal for both quality control and process optimization.

MESO VIS – Fizeau-Like Metrology in Visible & NIR

MESO VIS is optimized for visible and near-infrared applications, enabling at-wavelength testing of flat optics with high accuracy.

Key Capabilities

  • LIFT-enhanced high wavefront sensing resolution

  • Spot Tracker™ technology for absolute tilt and wavefront measurement

  • Insensitive to vibrations and environmental disturbances

  • Optical zoom from 1.5” (38 mm) to 6” (152 mm)

  • Multi-wavelength testing from 405 nm to 820 nm

  • Horizontal or vertical integration

Typical Applications

  • Flat and plane-parallel optics

  • Mirrors, windows and beamsplitters

  • Filters and dichroics

  • Glass wafers and substrates

  • Displays and screens

  • Large lenses and optical systems

MESO SWIR – Fizeau-Like Metrology for Infrared Optics

MESO SWIR extends the same Fizeau-like metrology principles to optics designed for short-wave infrared applications. It enables consistent measurement strategies across VIS, NIR and SWIR components, supporting manufacturers working with multi-spectral optical systems.

MESO SWIR offers the same robustness, automation and vibration insensitivity, ensuring reliable metrology for infrared optical components.

Key Advantages of MESO Fizeau-Like Metrology Systems

  • Comparable accuracy to classical Fizeau interferometry

  • Vibration-insensitive operation for shop-floor use

  • At-design wavelength testing with no chromatic aberration

  • Reliable testing of thin and plane-parallel optics using patented POP procedure

  • Fast acquisition times suitable for high-throughput manufacturing

  • Automated testing, reporting and ISO 10110 compliance

Production-Oriented Metrology Software

MESO systems are powered by WAVESURF, a software platform developed for industrial optical metrology.

  • Guided and scripted testing procedures

  • Automated control of wavelength and test diameter

  • Complete automated test reports

  • Multi-format data export

  • Operator-friendly interface for manufacturing environments

A Complete Fizeau-Like Metrology Workflow

In modern optical manufacturing, Fizeau-like metrology systems such as MESO complement laboratory-based interferometers by enabling fast, robust and at-wavelength measurements in production environments.

MESO VIS and MESO SWIR provide a scalable and consistent metrology solution across spectral ranges, ensuring optical quality from prototype to series production.

Contact Imagine Optic to learn how MESO Fizeau-like metrology systems can be integrated into your optical manufacturing workflow.