LIFT 680 Wavefront sensor

Premium Ultra High Resolution wavefront sensing in the 400-750nm spectrum
The LIFT 680 combines the highest resolution provided by the phase retrieval LIFT technology with a large analysis pupil and a large dynamic range. It features the new SpotTracker technology, which provides absolute wavefront sensing and tilt information and makes sensor alignment a mere formality.
LIFT 680 ultra high resolution phase retrieval wavefront sensor for visible wavelengths

Specifications

Pupil size 13.8 x 10.2 mm²
Absolute Accuracy (RMS) λ/100
Repeatablility (RMS) < λ/200
Phase Point Resolution 680 x 504
Interface USB3
Wavelength 400-750nm
Max. acquisition frequency 30 Hz

Datasheet

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LIFT LP VIS & BROADBAND PHASE RETRIEVAL

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LIFT 680 Wavefront sensor

The LIFT 680 phase retrieval wavefront sensor combines all the unique features developed by Imagine Optic during 30+ years of innovation and customers feedback: ease of use (absolute measurement thanks to the embedded factory calibration), high performance (high accuracy of lambda/100 RMS, very large dynamic range), robustness (phase measurement independent of beam intensity variation, achromaticity over calibrated spectral range, insensitivity to vibrations) together with ultra high resolution (spatial resolution x16 compared with Shack Hartmann).

Applications

+ Quantify optical system’s aberrations
+ Characterize complex optics
+ Measure Mid-spatial frequency (MSF) errors
+ Check if optical mount distorts optics
+ Verify compliance with specifications
+ Align system for optimal performance
+ Predict system’s focalization and imaging quality
+ Measure effects of temperature and gravity on performance
+ Diagnose laser beam, adjust and check pointing stability
+ Collimate optical systems and lasers
+ Quantify optical components and systems dependency to wavelength

Best For

+ High spatial sampling testing
+ Large dynamic range applications
+ Freeform optics, parabolic mirrors characterization

Software

WAVEVIEW (included) is the most advanced wavefront measurement and analysis software including more than 150 features and tools optimized for a wide range of highly demanding applications.
+ Extensions for PSF, MTF, Strehl ratio, M-Squared parameter and Advanced Zernike (annular or elliptical)