METROLOGY Archives | Imagine Optic https://www.imagine-optic.com/tag/metrology/ Wavefront Sensing, Optical Metrology & Adaptive Optics Fri, 30 Jan 2026 14:38:52 +0000 en-US hourly 1 https://wordpress.org/?v=6.9 https://www.imagine-optic.com/wp-content/uploads/2021/02/cropped-favicon-imagine-32x32.png METROLOGY Archives | Imagine Optic https://www.imagine-optic.com/tag/metrology/ 32 32 Nanolite, a CEA-Imagine Optic joint lab on Extreme UV metrology https://www.imagine-optic.com/nanolite-extreme-uv-metrology/ Tue, 06 Dec 2022 13:38:05 +0000 https://www.imagine-optic.com/?p=265385 The post Nanolite, a CEA-Imagine Optic joint lab on Extreme UV metrology appeared first on Imagine Optic.

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 Extreme UV metrology joint Lab, Nanlite , Imagine Optic – CEA

NANOLITE, the novel optical metrology platform for extreme UV enters operational phase.

Nanolite, established January 2020, is a joint collaboration and laboratory between the LIDYL CEA laboratory (CEA-CNRS) and Imagine Optic, focusing on innovative optical metrology and imaging solutions at short wavelengths, in particular in the Extreme-UV (EUV, typically between 10 and 100nm) range. Along the Nanolite roadmap, a major milestone is the availability of a novel EUV source providing large photon flux, high stability and beam quality, based on the use of an original laser source. This first milestone has recently been successfully passed.

This high-performance beamline will now serve as a key device to advance the next Nanolite objectives. On top of being an ultra-precise calibration source for current EUV wavefront sensors and future developments, it will enable the development of “at lambda” metrology solutions, in particular for the qualification of X-EUV optics. Such optics, e.g. used in Synchrotron beamlines, ideally require accurate quality control before installation, which is currently not possible with the required level of precision when based on measurements in the visible range. At lambda wavefront sensing in a context approaching its final working conditions will provide both increased accuracy and more relevant results. Moreover, the source will also contribute to the next developments on ultrafast nanometric imaging mainly driven by LIDYL, with applications focused on the study of ultrafast magnetization – a possible key tool to drive the electronics of the future.

By providing their expertise in the characterization and the generation of “made-to-measure wavefronts” Imagine Optic is happy to contribute to the definition of novel metrology solutions in the short wavelengths, on top of our current range of wavefront sensors such as HASO-EUV or HASO HXR

 

 

Read the full announcement by CEA hereunder (French only).

 

 

 

 

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The dichroic beam-splitter of EUCLID telescope will be characterized by Imagine Optic’s OBSERVE. https://www.imagine-optic.com/dichroic-beam-splitter-telescope/ Tue, 29 Mar 2022 12:05:42 +0000 https://www.imagine-optic.com/?p=262949 The post The dichroic beam-splitter of EUCLID telescope will be characterized by Imagine Optic’s OBSERVE. appeared first on Imagine Optic.

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Imagine Optic has been working for the European Space Agency (ESA) since last Summer on designing an optical bench to characterize the dichroic beam-splitter of the EUCLID telescope.

EUCLID’s main mission is to map dark matter throughout the universe with unprecedented precision. This delicate and complex task relies on many factors, and the ability to separate between different wavelengths with great precision is a major requirement. 

The optical bench, codenamed OBSERVE will perform analysis of the reflected wavefront with an accuracy exceeding 1nm RMS, for a large wavelength range covering EUCLID’s VIS instrument needs (500-950 nm). It will be installed in Q4 2022 at the Laboratoire des Matériaux Avancés de Lyon where this final ultra-precise characterization will be done on a perfect clone of the beam-splitter that will fly to space at the same period from ESA’s launchpad in Kourou.

If you’re interested in finding out more about our line of Wavefront Sensors and Optical Metrology Systems, or more specific expertise you can reach us at sales@imagine-optic.com .

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WaveSuite goes full 64 bits: 3x processing speed, no-limit RAM & M2 https://www.imagine-optic.com/wavesuite-optical-metrology-adaptive-optics-software/ Tue, 13 Jul 2021 10:22:49 +0000 https://www.imagine-optic.com/?p=261970 WaveSuite 4.3 optical metrology and adaptive optics software completes the full transition to 64-bit compilation and overhauls previous limitations in RAM management and processing speed linked to 32-bit architecture legacy. This version of WaveSuite is a landmark for metrology and Adaptive Optics software, bringing huge benefits to our clients and users and synchronizing the version numbering of the three softwares:– Waveview 4.3, the bench […]

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WaveSuite 4.3 optical metrology and adaptive optics software completes the full transition to 64-bit compilation and overhauls previous limitations in RAM management and processing speed linked to 32-bit architecture legacy.

This version of WaveSuite is a landmark for metrology and Adaptive Optics software, bringing huge benefits to our clients and users and synchronizing the version numbering of the three softwares:
– Waveview 4.3, the bench mark in wavefront metrology
– Wavetune 4.3, for perfect loop control
– Wavekit 4.3, a versatile and comprehensive SDK in C, LabVIEW and Python.

The first benefit is the end of the 4 GB RAM limit, allowing virtually unlimited image buffers and/or up to 4x phase point measurement at full speed. All applications’ performance will benefit from this breakthrough, especially those involving high-frequency/high-resolution sampling.

The second major benefit is to processing speed, with computing speed up 3x allowing for quicker calculations of wavefronts, intensity, PSF, MTF, and most importantly the LIFT algorithms that power our new HASO LIFT series with 272 x 200 and 680 x 500 phase point sampling.

Last but not least, the M2 function returns, thanks to these memory and speed improvements with better than laser beam simulations.

WaveSuite4.3 is the version currently being delivered with new wavefront sensors, optical metrology systems and deformable mirrors. It will soon be available as an upgrade for compatible hardware. If you would like more information, please get in touch with us at sales@imagine-optic.com.

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GAIA telescope alignment with our R-FLEX system https://www.imagine-optic.com/gaia-telescope-alignment-with-our-r-flex-system/ Wed, 24 Feb 2021 15:05:26 +0000 https://www.imagine-optic.com/?p=261098 The post GAIA telescope alignment with our R-FLEX system appeared first on Imagine Optic.

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The purpose of the GAIA mission is to provide a three-dimensional map of approximately one billion stars throughout the galaxy and beyond. It gives the detailed physical properties of each star, gathering basic observational data to tackle a large range of problems related to the origin, structure and evolutionary history of our galaxy.

The principal and most prominent feature of the Gaia mission during its manufacture was the high-precision optical payload. Indeed, the telescope is composed of two telescopes that combine their image on the same detector. Therefore, the alignment is absolutely critical.

To carry out the alignment of the three mirrors on each of the two telescopes, Astrium (now Airbus Defense and Space) has chosen to use the R-FLEX from Imagine Optic. The R-FLEX is an optical metrology instrument that characterizes the aberrations of an optical system in a “double-pass” configuration. The alignment process, based on wavefront measurements compared to a predictive model realized with CODE V, is described in detail in the article “The optical alignment of the two GAIA three mirror anastigmatic telescopes.”

The extreme accuracy of the R-FLEX combined with the quality of its implementation by ASTRIUM’s teams allowed the two GAIA telescopes to reach the necessary optical quality (i.e., 50 nm). Today, the Gaia mission is creating a precise three-dimensional map of astronomical objects throughout the Milky Way and also mapping their movements, which encode the origin and subsequent evolution of the Milky Way.

If you’re interested in finding out more about our line of Wavefront Sensors and Optical Metrology Systems, you can reach us at sales@imagine-optic.com or through the contact form (red enveloppe on the side).

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A brief history of Imagine Optic” #2: H-Line wavefront sensors https://www.imagine-optic.com/history-2-h-line/ Tue, 19 Jan 2021 11:56:36 +0000 https://www.imagine-optic.com/?p=12409 A brief history of Imagine Optic – Episode 2 Founded in December 1996 by the pair of Samuel Bucourt and Xavier Levecq, Imagine Optic is a pioneer in the manufacturing of optical metrology instruments and systems based on the Shack Hartmann wavefront measurement method. This is how the story of the company is usually written, […]

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A brief history of Imagine Optic – Episode 2

Founded in December 1996 by the pair of Samuel Bucourt and Xavier Levecq, Imagine Optic is a pioneer in the manufacturing of optical metrology instruments and systems based on the Shack Hartmann wavefront measurement method. This is how the story of the company is usually written, however some facets of history are easily masked or forgotten with time…

This series of articles will allow you to (re)discover the evolution of the commercialized products by Imagine Optic since its creation. Today, we focus on the H-Line, the forefather of our current family of HASO wavefront sensors. As introduced in our first article, the H-Line is derived from the PH-Line but functions as a standalone optical metrology sensor. Based on the Shack-Hartmann technology with a linear CCD, it was able to measure tilts, curvature and spherical aberration. It was a very competitive alternative to a wave-surface instrument, as rectangular CCD cameras were incredibly expensive back in 1997 (~10,000€, compared to a few hundred euros today).

This design allowed to have a huge amplitude of measurement (more than 10,000 λ) on collimated or very divergent/convergent beams, while maintaining the same λ/75 RMS absolute accuracy. One of its other advantages was the speed: because there was only a single line to measure, the frequency of acquisition was faster than 300 Hz in its standard version, which was outstanding for 1997, enabling users to adjust their setup in real time.
The development of the H-Line product lasted five years, during which Imagine Optic had the opportunity to establish comprehensive calibration processes for the instrument in order to reach unparalleled performances for this time. This R&D period was used to get a lot of knowledge and know-how in the manufacturing of wavefront sensors by discovering and addressing problems early on. These calibration methods continue to be used today for the production of every wavefront sensor we manufacture, more than twenty years later.

Once the first H-Line sensors were delivered, the first customers soon asked if it was possible to measure other aberration shapes, such as astigmatisms. The first solution of Imagine Optic was to apply a 90-degree rotation of the sensor in order to have two crossing lines to be able to obtain 21 of the first 36 Zernike polynomials, or a 45-degree rotation to obtain 32 of the first 36 polynomials. A second version of the H-Line was subsequently developed to directly incorporate two orthogonal CCD lines (and microlens lines) permitting the direct measurement of astigmatisms and coma. With this development the “H-Line 2D” was born.

The logical progression for the H-line was to replace linear measurements by measurements on a complete surface. The early 2000s saw a major reduction in price for rectangular CCD sensors which in turned facilitated the development of the “HASO” wavefront sensor, first manufactured in 1999, which implemented a rectangular CCD.

If you’re interested in finding out more about our line of Wavefront Sensors and Optical Metrology Systems, you can reach us at sales@imagine-optic.com or through the contact form (red enveloppe on the side).

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The Optical Engineer Companion, aka the “Swiss Army Knife” of optics in the SWIR explained in 3 videos. https://www.imagine-optic.com/swiss-army-knife/ Tue, 12 Jan 2021 17:39:09 +0000 https://www.imagine-optic.com/?p=12398 In this video series, Xavier Levecq, CSO Imagine Optic, presents the 3 products that compose the “Swiss Army Knife” of optics: the HASO SWIR wavefront sensor, the R-FLEX2 SWIR metreology platform, and the R-FLEX LA SWIR metrology system. Each subsequent product embeds the former and offers additional capabilities through a simple plug-and-click connection. The first […]

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In this video series, Xavier Levecq, CSO Imagine Optic, presents the 3 products that compose the “Swiss Army Knife” of optics: the HASO SWIR wavefront sensor, the R-FLEX2 SWIR metreology platform, and the R-FLEX LA SWIR metrology system. Each subsequent product embeds the former and offers additional capabilities through a simple plug-and-click connection.

The first part is provided by either a HASO SWIR or a HASO4 SWIR 1550. Their InGaAs camera and lens matrix coupled with Waveview4 software offer a high accuracy, a large dynamic range and a high-speed acquisition frequency. They both embed the new SpotTracker technology, providing absolute wavefront and tilt information and eliminating alignment requirements. They’re the ideal metrology tool for optical metrology, including complex lens alignment, aberrations measurement, PSF and MTF values, as well as adaptive optics applications such as long-range communication.

The second part is the R-Flex 2 SWIR metrology platform which is the central piece of the Optical Engineer Companion in the SWIR range. The second generation of our versatile optical metrology platform in the 900-1700 nm range instantly combines any of the HASO SWIR wavefront sensors with a collimator and a light source. They are commonly used to characterize optical surfaces, characterize chromatic aberrations, analyze the transmitted wavefront of optical systems with double-pass configuration and optimize complex lens alignement.

The third part is the R-FLEX LA SWIR, the large-diameter collimating system that extends the capabilities of the R-FLEX2 SWIR, and its embedded HASO SWIR, to large optics and numerous optical surfaces such as filters, dichroic beam splitters, head-up displays, eyewear, optical windows, flat mirrors, and polarization scramblers.

“All about SWIR” series
3 videos:

If you’re interested in finding out more about our line of Wavefront Sensors and Optical Metrology Systems, you can reach us at sales@imagine-optic.com or through the contact form (red enveloppe on the side).

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New generation phase sensing and imaging: the MaxPhase project https://www.imagine-optic.com/maxphase-project/ Tue, 24 Nov 2020 17:08:33 +0000 https://www.imagine-optic.com/?p=12350 Newly funded MaxPhase project will enable high-resolution, multiplexed phase sensing for metrology, laser characterization and non-invasive cell imaging. Phase measurement has been well established for decades as a valuable method in optical metrology and adaptive optics, in particular through the use of wavefront sensors or interferometers. However, new needs are now emerging that require tailored […]

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Newly funded MaxPhase project will enable high-resolution, multiplexed phase sensing for metrology, laser characterization and non-invasive cell imaging.

Phase measurement has been well established for decades as a valuable method in optical metrology and adaptive optics, in particular through the use of wavefront sensors or interferometers. However, new needs are now emerging that require tailored phase measurement capabilities. In particular, advances in optical manufacturing technologies have enabled the launch of components based on complex designs such as metasurfaces, micro-optics arrays, or diffractive optical elements, requiring advanced metrology tools. High-energy, ultrafast lasers need careful characterization and optimization of spatio-spectral coupling effects. Cell imaging now requires non-invasive methods to assess cellular parameters over long periods, ideally in 3D.

These needs benefit from phase imaging, either through the use of wavefront sensors for optical metrology or laser characterization, or through the use of quantitative phase imaging systems. However, current technologies do not yet provide the necessary combination of resolution, sensitivity, speed, versatility and cost-effectiveness.

The MaxPhase project was recently awarded funding by the French National Research Agency (ANR). It will gather a consortium of academic and industrial experts with the aim to develop new phase sensing approaches, tackling current technological limits in the field. Imagine Optic is proud to participate in this collective effort, which has the potential to open doors for future innovative products allowing ultrafast laser characterization and quantitative phase imaging & tomography. The MaxPhase project has received funding under the ANR-AAPG 2020 call.

If you’re interested in finding out more about our line of Wavefront Sensors and Optical Metrology Systems and adaptive optics you can reach us at sales@imagine-optic.com or through the contact form (red enveloppe on the side).

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(Re)Watch Webinar 05: All about SWIR https://www.imagine-optic.com/webinar-05-swir/ Mon, 23 Nov 2020 12:28:32 +0000 https://www.imagine-optic.com/?p=12332 Watch or rewatch “All about SWIR” our 5th Webinar on wavefront sensing and optics characterization, you can find it now on our Youtube channel.    Xavier Levecq, CSO, walks you through a presentation and live demo of optics and optical systems characterization in the SWIR using and combining 3 complementary instruments: – the HASO SWIR […]

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Watch or rewatch “All about SWIR” our 5th Webinar on wavefront sensing and optics characterization, you can find it now on our Youtube channel.
 
 Xavier Levecq, CSO, walks you through a presentation and live demo of optics and optical systems characterization in the SWIR using and combining 3 complementary instruments:
 
UPDATE (2022) : the Swiss-Army Knife of Optics has been rebranded the Optical Engineer Companion with new sensors and options in both VIS-NIR and SWIR, offering up to 800 combinations to build and evolve the perfect optical metrology tool.
 
If you’re interested in finding out more about our line of Wavefront Sensors and Optical Metrology Systems, you can reach us at sales@imagine-optic.com or through the contact form (red enveloppe on the side).

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Hard X-Ray wavefront sensing now standard https://www.imagine-optic.com/hard-xray-wavefront-sensing/ Wed, 04 Nov 2020 09:43:23 +0000 https://www.imagine-optic.com/?p=12298 The post Hard X-Ray wavefront sensing now standard appeared first on Imagine Optic.

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HARD X-Ray Wavefront Sensing to our standard product range. New HASO HXR wavefront sensor now provides beamline scientists a robust, versatile industrial tool for hard X-rays optical metrology, enabling them to precisely characterize and optimize beam quality.

 

Precision Optical Metrology for Synchrotrons and X-FELs

 

Accurate Hard X-ray characterization is essential for unlocking the full potential of high-energy beams in Synchrotrons or X-FELs. When targeting optimal beam quality or diffraction-limited focusing, live measurement and visualization of the wavefront is key. This achieves perfect alignment of high-quality optics, such as Kirkpatrick-Baez (KB) or Wölter telescopes. This is especially true in the context of 4th-generation Light Sources that provide enhanced coherence and brilliance.

 

The Imagine Optic Advantage in Wavefront Sensing

 

Based on more than 20 years of experience in wavefront sensing, as well as on collaborations with beamline scientists, Imagine Optic developed the HASO HXR, a wavefront sensor based on the Hartmann technique.

 

Real-Time Hard X-ray Characterization

The system is designed to solve the challenges of Hard X-ray Metrology and deliver immediate results:

  • Single-shot measurement and live visualization of the wavefront.
  • Broad energy range
  • High accuracy
  • Achromatic and highly compact for use at multiple locations along a beamline.

Applications in Advanced HARD X-Ray Wavefront Sensing

 

Because a wavefront sensor provides a quantitative measurement of the optical phase, the HASO HXR is invaluable for cutting-edge research:

  • Active Optics Control: The device has been recently demonstrated as an efficient tool for controlling active optics (Adaptive Optics, AO), providing the crucial feedback loop for dynamic X-ray optics alignment (more details in the corresponding publication).
  • Phase Imaging: The system can be used as a high-performance phase imaging system for applications like non-destructive analysis in material science, nanobeam characterization, and biological sample analysis.

For wavefront sensing at lower energies, such as in the EUV range, please also check our HASO EUV wavefront sensor here. If you’re interested in finding out more about our line of Wavefront Sensors for X-rays and EUV, you can reach us at sales@imagine-optic.com

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Kickstarting Shack-Hartmann wavefront metrology in the 1990s: the PH-Line https://www.imagine-optic.com/history-1-ph-line/ Mon, 31 Aug 2020 15:58:46 +0000 https://www.imagine-optic.com/?p=12149 A brief history of Imagine Optic – Episode 1 Founded in December 1996 by the pair Bucourt-Levecq, Imagine Optic was a pioneer in developing and manufacturing optical metrology instruments and systems based on the Shack-Hartmann wavefront measurement methods. This series of articles looks back at the evolution of instruments and software designed and delivered by […]

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A brief history of Imagine Optic – Episode 1

Founded in December 1996 by the pair Bucourt-Levecq, Imagine Optic was a pioneer in developing and manufacturing optical metrology instruments and systems based on the Shack-Hartmann wavefront measurement methods. This series of articles looks back at the evolution of instruments and software designed and delivered by Imagine Optic since its creation. Today, we focus on the oldest ancestor of our HASO wavefront sensors ; the PH-Line.

Imagine Optic’s first product a probe with the ability to measure the curvature of a wavefront. This system, named “PH-Line”, was equipped with a source directed towards the surface to be analyzed and a lens used to collimate the beam on an optical detection head. The latter consisted of a linear CCD chip, a much cheaper at the time compared to square or rectangular ones, combined with a line of microlenses. The linear CCD chip was 26 mm long and had 2048 pixels, while the microlens line was composed of a hundred cylindrical lenses.

The resulting measurement was a waveline that gave information on tilts, curvatures and spherical aberrations thanks to the Shack-Hartmann technology. This PH-Line profilometer was integrated into a 3D platform and delivered to the “Laboratoire Central des Ponts et Chaussées” (Central Laboratory for Roads and Bridges) in order to measure the deformation of bitumen due to rolling, and to INRA (National Institute for Agricultural Research) to measure clods of dirt during hydraulic erosion tests.

Some drawbacks of the system were quickly identified, namely the instrument’s inability to measure aberrations other than curvature since it was only able to measure wavelines (as opposed to complete wavefronts). Moreover, this product was in direct competition with deflectometry probes which is why the company decided to develop a system based on the detection head of the PH-Line: the H-Line.

To be continued…

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