Ultimate precision and accuracy for high-end applications
The HASO3 128 GE2 Shack Hartmann wavefront sensor offers unique measurement performance capabilities with the following key features :
- highest-resolution : 16,384 independent measurement points
- largest aperture dimension of 14.6 x 14.6 mm²
- simultaneous and independent measurement of both phase & intensity measurement
- largest available dynamic range
- temperature stabilized for long term measurements
The HASO 3 128 GE2 offers the highest level of performance ever achieved with a wavefront sensor. It has been used with success in the most demanding applications in optical metrology and laser diagnostics, It is the ultimate candidate for demanding optical metrology applications in science or the industry.
HASO 3 128 GE2 is delivered with WaveView, the 3rd generation of wavefront analysis software. With just a few clicks, you will get access to wavefront measurement, reconstruction etc . WaveView offers more than 150 functions and optional add-ons enable you to go even further and calculate the PSF, MTF, Strehl ratio and the M².
WaveKit (or Software Development Kit – SDK) will enable you to interface the HASO 4 Broadband with any kind of OEM products and systems.
On request, customized software solutions, perfectly adapted to your application case can be developed . Our engineering team will ensure sustainable product integration and maintenance for a long product lifetime.
Specifications
HASO3 128 GE2
| Description | Specification |
|---|---|
| Aperture dimension | 14.6 x 14.6 mm² |
| Number of microlenses | 128 x 128 |
| Tilt dynamic range | >±3° (1500 λ) |
| Focus dynamic range – minimum local radius of curvature | 15 mm |
| Focus dynamic range – maximum NA | > 0.1 |
| Repeatability (rms) | < λ/200 |
| Wavefront measurement accuracy in relative mode (rms)1 | around λ/150 |
| Wavefront measurement accuracy in absolute mode (rms)² | around λ/100 |
| Tilt measurement sensitivity (rms) | <1 µrad |
| Focus measurement sensitivity (rms) | 2.5·10-4 m-1 |
| Spatial sampling | around 110 µm |
| Maximum acquisition frequency (sequential acquisition) | 7.5 Hz |
| Processing frequency (CPU 3Ghz, 512 Mb RAM) | 5.0 Hz |
| Working wavelength range | 400 – 1100 nm |
| Calibrated wavelength range | A (400 – 600 nm), B (500 – 700 nm), C (630 – 900 nm), D (800 – 1100 nm) |
| Extended wavelength range* | A+ (400 – 700 nm) and B+ (500 – 900 nm) |
| Dimensions / weight | 115 x 51 x 60 mm / 400 g |
| Working temperature | 15 – 30° C |
| Interface / Power supply | Giga Ethernet / 12 V / 6 W |
| Operating system | Windows 7 and 10 |
| HASOv3 metrology software | included |
| External trigger | yes |
| (1) Wavefront as seen by the device.
(2) Difference between the real wavefront and a reference wavefront obtained in similar conditions (5λ of shift max). * sold separately |
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Content of product delivery:
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Downloads
Service Documents
Optical metrology | Application note: Optical metrology measurements with HASO
Eyewear inspection | Application note : Eyewear and smart glass quality control
Wavefront sensor and beam profiler | Application note : HASO wavefront sensor : phase + intensity measurements
Absolute measurement | Application note : How to characterize a wavefront sensor
Thermal lens | Article : Thermal lens measurement with HASO wavefront sensor
Adaptive optics and wavefront quality | Article : How adaptive optics can improve intensity on the target.