Build Your Ideal Adaptive Optics System for Microscopy
AOKit Bio allows you to build the adaptive optics system that best suits your individual needs. Whichever microscopy method you are using, adaptive optics allows you to pre-compensate aberrations present in your imaging system and to improve your image quality.
AOKit Bio is a set of adaptive optics components, composed of a Shack-Hartmann wavefront sensor (HASO4 First for visible or HASO4 SWIR for the infrared spectral range), Mirao 52e or any other deformable mirror or phase modulator (please contact Imagine Optic in advance to check the compatibility and availability), as well as adaptive optics software. You can choose between the WaveKit Bio set of functions (SDK) or a fully functional adaptive optics software with a user interface. Both software control all functionalities of the wavefront sensor and deformable mirror, can operate these devices in closed and open-loop modes and contain image-based (sensorless) aberration detection algorithms (3N and phase diversity) adapted for microscopy applications.
We recommend implementing AOKit Bio for the following microscopy techniques: wide field, confocal, multiphoton, light sheet, STED and SIM microscopy, as well as FCS or optical tweezers.
The AOKit Bio consists of the HASO4 First wavefront sensor and the Mirao 52e electromagnetically deformable mirror. Here are specifications of Mirao 52e :
|Number of actuators||52|
|Maximum generated wavefront (PV)||±50 µm|
|Surface quality (rms active flat)||10 nm|
|Integrated tip/tilt correction||yes|
|Spatial frequency correction Zernike orders||up to 6|
|Effective diameter||15 mm|
|Actuator input voltage||±1V maximum*|
|Power consumption||50W max|
|Dimensions / weight||64 x 64 x 23 mm3 / 490g**|
|Operating System||Windows XP, Windows 7 (32 and 64 bit) and Windows 10|
|(*) Total sum of applied voltages not to exceed 25V.
(**) Mirror unit only.
|Aperture dimension||3.6 x 4.6 mm²|
|Number of microlenses||32 x 40|
|Tilt dynamic range||> ± 3 ° (400 λ)|
|Focus dynamic range||± 0.018 m to ± ∞ (350 λ)|
|Focus dynamic range – maximum NA||0.1|
|Repeatability (rms)||< λ/200|
|Wavefront measurement accuracy in relative mode (rms)*||~ λ/150|
|Wavefront measurement accuracy in absolute mode (rms)**||~ λ/100|
|Tilt measurement sensitivity (rms)||5 μrad|
|Focus measurement sensitivity (rms)||3·10-3m-1|
|Spatial resolution||~ 110 μm|
|Maximum acquisition frequency||100 Hz|
|Processing frequency (CPU 3Ghz, 512 Mb RAM)||20 Hz|
|Working wavelength range||350 – 1100 nm|
|Calibrated wavelength||in the 400-1100 nm range, details on request***|
|Extended wavelength range||not available|
|Dimensions / weight||42x 42 x 42 mm3 /150g|
|Working temperature||15 – 30° C|
|Interface / Power supply||USB 3.0 / 2.7 W via USB|
|Operating system||Windows 7 (32 and 64 bit) and Windows 10|
|WaveViewTM metrology software||included|
|(*) Wavefront as seen by the device.
(**) Difference between the real wavefront and a reference wavefront obtained in similar conditions (5λ of shift max).
(***) Single wavelength calibration (+- 50 nm), second wavelength calibration available on request.