Build Your Ideal Adaptive Optics System for Microscopy
The AOKit – bio allows you to build the adaptive optics system best suited to you individual needs. Whatever configuration you choose, it allows you to pre-compensate for your imaging system’s aberrations to start off with the best possible native quality. We equally offer a software development kit that allows you to build your own adaptive-optics software to perfectly meet your needs.
For custom-built setups and custom implementations of deformable mirror, Imagine Optic offers a package of key elements of adaptive optics, called AOKit Bio. This set includes the Shack-Hartmann type Haso4 First wavefront sensor and mirao 52e deformable mirror. These wavefront sensor and deformable mirror proved to be ideal solution for microscopy, already implemented on a number of different microscopy setups all over the world. AOKit Bio also includes the software program, which controls all the functionality of the wavefront sensor and deformable mirror and also contains the aberration correction and image improvement iterative algorithms (genetic, 2N+1 and modified 3N). Under request we also provide the Software Development Kit (SDK) source code so these devices could be managed from the customer build control software. AOKit Bio is typically implemented in these microscopy methods: multiphoton microscopy, SPIM or light sheet microscopy, but it is also possible to improve imaging in SIM, FCS , optical tweezers etc.
The AOKit BIO consists of the HASO4 First wavefront sensor and the mirao 52-e electromagnetically deformable mirror. Here are specifications of mirao 52-e :
|Number of actuators||52|
|Maximum generated wavefront (PV)||±50 µm|
|Surface quality (rms active flat)||10 nm|
|Integrated tip/tilt correction||yes|
|Spatial frequency correction Zernike orders||up to 6|
|Effective diameter||15 mm|
|Actuator input voltage||±1V maximum1|
|Power consumption||50W max|
|Dimensions / weight||64 x 64 x 23 mm / 490g2|
|Operating System||Windows XP, 7 (x32 – x64 under evaluation)|
|(1) Total sum of applied voltages not to exceed 25V.
(2) Mirror unit only.
|Aperture dimension||3.6 x 4.6 mm²|
|Number of microlenses||32 x 40|
|Tilt dynamic range||> ± 3 ° (400 λ)|
|Focus dynamic range||± 0.018 m to ± ∞ (350 λ)|
|Focus dynamic range – maximum NA||0.1|
|Repeatability (rms)||< λ/200|
|Wavefront measurement accuracy in relative mode (rms)1||~ λ/150|
|Wavefront measurement accuracy in absolute mode (rms)²||~ λ/100|
|Tilt measurement sensitivity (rms)||5 μrad|
|Focus measurement sensitivity (rms)||3·10-3m-1|
|Spatial resolution||~ 110 μm|
|Maximum acquisition frequency||100 Hz|
|Processing frequency (CPU 3Ghz, 512 Mb RAM)||20 Hz|
|Working wavelength range||350 – 1100 nm|
|Calibrated wavelength||in the 400-1100 nm range, details on request3|
|Extended wavelength range||not available|
|Dimensions / weight||42x 42 x 42 mm /150g|
|Working temperature||15 – 30° C|
|Interface / Power supply||USB 3.0 / 2.7 W via USB|
|Operating system||Win 7 (x86 / x64)|
|HASOv3 metrology software||included|
|(1) Wavefront as seen by the device.
(2) Difference between the real wavefront and a reference wavefront obtained in similar conditions (5λ of shift max).
(3) Single wavelength calibration (+- 50 nm), second wavelength calibration available on request.