HASO4 R-Flex50 » Imagine Optic

Optical characterization tool with visible or NIR light

HASO4 R-Flex50 is an optical metrology tool that gives the possibility of using several characterizing wavelengths for optical components and system inspection.

Key features

3400 independent measurement points
simultaneous and independent measurement of both phase & intensity
true absolute measurement
unbeatable accuracy and dynamic range
temperature stabilized for long term measurements
capability to use change the characterizing wavelengths in the visible and NIR spectrum range

Examples of applications

Analysis of the transmitted wavefront of optical systems with double-pass configuration
Optical surfaces inspections
Detection of chromatic aberrations
Telescope alignment and wavefront error measurement

HASO R-Flex unites Imagine Optic’s patented HASO Shack-Hartmann wavefront sensors with a collimator and a focusing module to provide users with a versatile and turnkey solution for precision characterization of optical systems and surfaces. Its standard accuracy of λ/100, λ/200 in double pass configurations, and insensitivity to vibrations or atmospheric turbulence enable users to perform measurements that meet the most stringent requirements for reliable, repeatable results. Even more, accuracy can be further increased if the measured aberration is close to the diffraction limit.

Because different users have different needs, the f/# of HASO R-Flex can be adapted to each user’s requirements by choosing the focusing module best suited for the task at hand. As the sample f/# defines the best focusing module, Imagine Optic offers factory models that are available from f/#=1 to f/#=15 to ensure maximum sampling points, whereas custom models for special needs can equally be delivered. Please see the product page of standard focusing units.

Recently, we developed HASO4 R-Flex50 for two wavelength ranges; 400-700nm (VIS) and 650-1100nm (NIR). This broadens the capacity of the HASO R-Flex to inspect optical components in term of chromatic aberrations for example.

Characterizing large optical components or complex systems is performed easily as the exit beam is divergent, thereby allowing users to set to focal spot to any point. When set at the centre of concave mirrors, surface defects can be measured and analyzed.

HASO R-Flex is delivered with WaveView wavefront measurement and analysis software that runs under Windows 7. It displays aberrations in real-time so that users can immediately see the effects of various positioning or alignment adjustments.

Its small footprint allows to it be easily mounted onto translation stages so samples can be measured on-axis or at any point in the field.

Specifications

HASO4 R-FLEX 50

For 400-700 nm
HASO4 R-Flex 50 VIS	Pupil size (mm²)	Sensitivity rms (nm)⁽¹⁾	Relative Accuracy rms (nm) ⁽¹⁾	Sampling points	Weight (kg)	Size (mm³)
HASO4 R-Flex 50 VIS	5.2 x 7.0	3	4	50 x 68	0.5	110 x 60 x 122
Focusing Modules	Focal length (mm) ⁽²⁾	F-number	WFE (nm rms) ⁽³⁾	Working distance (mm) ⁽⁴⁾	Pupil imaging ⁽⁵⁾	Required power back
MOD50-1 VIS	4.5	1	60	0.6	YES*	80%
MOD50-2 VIS	9	2	30	1.2	YES*	80%
MOD50-4 VIS	19	3.6	150	-2.5	YES	4%
MOD50-6 VIS	31	6	80	5.5	YES	4%
MOD50-12 VIS	60.4	11.6	60	54.5	YES	4%
MOD50-15 VIS	75.2	14.5	50	73.1	YES	4%
AFO-x1	Afocal, x1 manification
* This module has to be used in association with AFO-x1.

For 650-1100 nm
HASO4 R-Flex 50 NIR	Pupil size (mm²)	Sensitivity rms (nm) ⁽¹⁾	Relative Accuracy rms (nm) ⁽¹⁾	Sampling points	Weight (kg)	Size (mm³)
HASO4 R-Flex 50 NIR	5.2 x 7.0	3	4	50 x 68	0.5	110 x 60 x 122
Focusing Modules	Focal length (mm) ⁽²⁾	F-number	WFE (nm rms) ⁽³⁾	Working distance (mm) ⁽⁴⁾	Pupil imaging ⁽⁵⁾	Required power back
MOD50-4 NIR	19	3.6	150	-2.5	YES	4%
MOD50-6 NIR	30	6	80	5.8	YES	4%
MOD50-12 NIR	60.1	11.6	60	55.8	YES	4%
MOD50-15 NIR	75.1	14.4	50	72.1	YES	4%


(1) can be divided by 2 if the optical system under test is characterized by double-pass method
(2) focal length of the module
(3) WFE is the wavefront error at the output of the module for the largest included round pupil.
(4) distance between the focalization point and the first optics (alignement holes must be removed)
(5) YES means that the microlenses are imaged at infinity by the module.