Metrology and adaptive optics solutions for X-ray and EUV applications

Extreme UVs and X-Rays are giving access to incomparable level of information, they are now commonly used for research in physics, life sciences, materials sciences. Light properties in these band  of the spectrum require the use of very specifics optics used in very particular conditions and for which the optical quality standards have been pushed to the limits of the optical detections methods. Adaptive optics is also a critical part of X-EUV sources, especially in applications requiring tight focusing and focal plane control.

Imagine Optic has been involved in a large number of projects involving the production or the transport of  X – EUVs. Over the years, we have developed innovative solutions for at-wavelength wavefront sensing, active correction strategies and optical metrology solutions dedicated to the metrology of EUVs and X-rays components.

We’re now also involved  in the application and being asked to develop imaging techniques based on wavefront sensing techniques.

Download: Publication list | X-EUV

Go to product page: HASO EUV or SHARPeR