Increase the resolution

Stimulated emission depletion (STED) microscopy is a variant of super resolution microscopy, for which the Point Spread Function (PSF) quality is very important. In this microscopy technique, the gaussian excitation beam is centered with the donut-shaped quenching (STED) beam, leaving only the central part of the gaussian beam unquenched. Aberrations distort the STED beam, thus the quenching of the excitation beam becomes inhomogeneous, leading to a loss of resolution as well as artifacts. This method is even more sensitive to aberrations in the 3D variant where the STED beam has a more complex shape.

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