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StitchWave™ wavefront stitching software
 
  stitchSitchWave is a unique software tool that, when used in conjunction with HASO™v3's move & measure option, enables precise characterization of large surfaces using our HASO wavefront sensors. Thanks to its advanced stitching algorithms that minimize translation stage effects, you can significantly extend the lateral resolution of your HASO and reconstruct a complete wavefront from multiple sequential measurements.

The top-left image shows the easily configurable HASOv3 move and measure option, whereas the two lower images show the results of stitching both as a color coded image and a plotted chart that indicate the surface imperfections with extreme detail.

If you would like more information, please call +33 (0)1 64 86 15 60 or e-mail us by clicking here.

 

 
Applications
 

Ideal for characterizing:

• large diameter optics
• aspheric components

 

Complementary products
  PDFThe SH-LTP (Shack-Hartmann Long Trace Profiler) is the ideal solution for characterizing large surfacest. Click here to learn more.  

 
 
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