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HASO™ HP-GE Shack-Hartmann wavefront sensors
 
  HASO-HPHASO HP Shack-Hartmann wavefront sensors provide sub-nanometric precision with the standard functionalities that HASO customers have come to rely on, including absolute measurement, wide dynamic range, unequalled accuracy and insensitivity to vibration.

Perfectly compatible with our LIP™ and ΘXΘY™ Rotation Stage accessories, HASO HP allows you to avoid using expensive components including null lenses or CGH matrixes, and is ideal for characterizing mirrors and catadioptric systems as well as aligning high-precision optical systems.

HASO HP-GE is delivered with HASOv3, our industry leading wavefront analysis software. With just a few clicks, you can perform both zonal and modal wavefront reconstruction as well as visualize the spot image and raw camera data. Optional add-ons enable you to go even further and calculate the PSF, MTF, Strehl ratio and obtain the M² parameter.

Technical specifications are detailed in the table below. If you would like more information, please call +33 (0)1 64 86 15 60 or e-mail us by clicking here.

Aperture dimension 13.5 x 13.5 mm²
Number of microlenses1 30 x 30
Tilt dynamic range > ± 0.5 °
Focus dynamic range ± 0.35 m to ± ∞ 
Measurement dynamic (specified in local curvature) ± 0.30 m
Repeatability (rms) < λ/3000
Wavefront measurement accuracy in absolute mode (rms)2 ~ λ/1000
Wavefront measurement accuracy in relative mode (rms)3 ~ λ/2000
Tilt measurement sensitivity (rms) 0.05 μrad
Focus measurement sensitivity (rms) 5.10-4 m-1
Spatial resolution ~ 450 μm
Maximum acquisition frequency 20 Hz
Processing frequency 2 - 10 Hz
Working wavelength range 350 - 500 nm
Calibrated wavelength range 390-430 nm
Working temperature 20 - 25°
Dimensions / weight 90 x 100 x 210 mm / 1500 g
Power supply +5,-5,-15,28 V / 20 W
Interface Giga Ethernet
Data represented here is based on the HeNe wavelength 633 nm. (1) other configurations are available. (2) wavefront as seen by the analyser. performance kept on the whole band. (3) difference between the real wavefront and a reference wavefront obtained in similar conditions (10 λ of shift max).
 
Companion software
 

HASOv3, delivered with all HASO sensors and available as an SDK, lets you get the most out of your wavefront sensor with wide-ranging functionalities. Click here to learn more.

Stitchwave is a unique software that complements HASOv3's move & measure option to enable you to characterize large surfaces. Click here to learn more.

  

Key HASO family features
 

Phase & intensity simultaneously and independently – Our patented sensor design enables you to measure both phase and intensity simultaneously and independently, in real time.

Absolute measurement – Our proprietary calibration technology and meticulous quality controls protocols eliminate the need for a reference beam and allow you to perform true absolute measurement.

Dynamic Spot Tracking™, Auto Spot Finder™ & Rotated Square™ technology – combined with the quality of our refractive microlens arrays provide superior accuracy and eliminate crossing spots, without comprising dynamic range.

  

Documentation
 

PDFProduct brochure - click the PDF icon to download.

  

Application notes
 

PDFTrue absolute measurement - This document talks about absolute measurement, what it is and how you can test your current wavefront sensor to see if it is capable. Click here to read the note.

  
 

PDFUsing your HASO with a beam profiler - In this application note, we discuss the utility and limitations of beam profilers and why HASO is the ideal complement. Click here to read the note.

  
 

PDFAdaptive optics for high-power lasers and the next generation of optical fuses - In this application note, we discuss how adaptive optics is currently used in high-power lasers and its future applications. Click here to read the note.

  
 

PDFAdaptive optics for high-power femtosecond lasers - In this application note, we discuss how we worked with the Max Plank Institute to implement an adaptive-optics closed-loop system into their femtosecond laser. Click here to read the note.

  
 
 
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