| Imagine Optic's turnkey solutions for industry and research are the fruit of 12 years of industry leading experience in wavefront metrology and adaptive optics. At the hearth of all of our solutions are the component technologies that have been widely acclaimed as industry standard setters for the precision, quality and versatility.
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SL-Sys™ neo
Fully automated wavefront characterization of high NA miniature optics from 1-12mm.
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SL-Sys™ liquid
Ensure quality and optimize production of liquid lenses.
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AOKit™ - bio
Delve deeper, see better using OCT, multiphoton, confocal and optical microscopes.
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LIP™
Augment the measurement capabilities of your HASO™3 sensor to characterize large sufaces.
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SH-LTP™
The Shack-Hartmann Long Trace Profiler is ideal for ultra-precise characterization of large surfaces.
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e-Xplorer™
Nanometric sensitivity in wafer planeness testing.
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