 Currently undergoing advanced R&D field testing, the e-Xplorer system is designed to help increase precision and reduce costs in manufacturing semiconductor wafers. Its outstanding nanometric sensitivity enables the system to detect even the most elusive defects in form and planeness on wafers up to six inches in diameter. An optional zoom x3 option allows you to significantly increase the system's lateral resolution without compromising precision.
If you would like more information, please call +33 (0)1 64 86 15 60 or e-mail us by clicking here.
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